Genetic Algorithms Based TFOMs Allocation for Complez Electronic Equipments
As general-purpose algorithms, genetic algorithms have been used in many fields, but rarely mentioned in testability engineering. Referring to testability allocation principles and models, the paper gives out genetic algorithms based method to optimize TFOMs allocation for complex electronic equipments. This method considers TFOMs allocation from the thought of concurrent engineering. System performance (reliability, safety, environment, supportability and life cycle cost) can be balanced together during the allocation process by use of genetic algorithms. Genetic algorithms can solve the problem of complex computation existing in process of TFOMs allocation The method can not only promote rate of successful TFOMs allocation, but save cost in test and diagnostics for complex equipments greatly.
TFOMs testability allocation genetic algorithms concurrent engineering
WANG Baolong HUANG Kaoli XU He LIAN Guangyao
Ordnance Technology Institute, Ordnance Engineering College, Shijiazhuang, China, 050003 Section of PLA Representation in 203 Research Institute, Xian, China
国际会议
第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)
重庆
英文
1635-1638
2009-08-01（万方平台首次上网日期，不代表论文的发表时间）