Study of Deep-hole Aperture Measurement Management System Based on Capacitance Sensor
In modern measurement, computer is the core of instruments control, data acquisition, data processing, data storage and information exchanging. Thus, developing a multi-function PC-based management system is critical for modern instruments. In this article, we provide a measurement management system, which is developed by NI LabVIEW, for deep-hole aperture measuring in high precision. The measurement is realized by capacitance sensors, which offer non-contact inspection. In this measurement system, a stepper motor is controlled to drive sensor going to different depths, a USB data acquisition card is operated and the measuring result can be displayed on computer during the measurement. A CCD camera is adopted to precisely position the capacitance sensor in the center of hole. Besides, a relational database developed by Microsoft Access is applied, so that all the information about the gauges and workpiece (demarcating information, measuring detail, and so on) can be stored and queried conveniently. The ODBC technology is used to make the operation of database possible.
Keywords- LabVIEW deep-hole measurement non-contact capacitance sensor database operation CCD camera precise positioning
Yu Yong-Xin Zhang Heng Chang Yi-Zhe Wang Zong-Chao Wang Bao-guang
School of Computer Science and Technology, Tianjin University, 300072, Tianjin, China National Institute of Metrology, P.R.China, Beijing, 100013, China School of Computer Science and Technology, Tianjin University, 300072, Tianjin, China College of Pre College of Precision Instruments & Opto-Electronics Engineering, Tianjin University, 300072,China
国际会议
第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)
重庆
英文
1807-1811
2009-08-01（万方平台首次上网日期，不代表论文的发表时间）