Study on the Micro Displacement Measuring System Based on Moire Fringe
According to the characteristic in the image region of Moire fringe, a micro-displacement measurement based on the Moire fringe is proposed. The principle of the micro-displacement measurement with Moire fringe in region Ⅱ is given, and verified by computer simulation. In Moire fringe hardware detecting system double-grating and a phototransistor are employed, through which the Moire fringe with the information of displacement is converted to sine electrical voltage in proportion to the intensity of Moire fringe. Further than that, subdividing and distinguishing circuits are used to 4-subdivision the signal and distinguish the displacement direction. Finally, the data are processed by a circuit system based on the single chip processor AT89C51. Resolution of the system is 0.5273 μm.
micro-displacement measurement Morie fringe 4-subdivision circuit single chip processor
QU Wei YE Hong an
The Key Lab of Electronic Engineering, College of Heilongjiang Province, Harbin, China, 150080 Department of Electronic Engineering, Heilongjiang University, Harbin,, China, 150080
国际会议
第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)
重庆
英文
2125-2128
2009-08-01（万方平台首次上网日期，不代表论文的发表时间）