Research on the Auto-testing System for Certain Equipment Based on VI Technology

摘要：

The certain equipment is a complicated electric system, and it is difficult to get its performance in one state. So it needs add the various exciting signals to the equipment in the process of testing. In this article, it has designed the auto-testing system for the equipment based on Virtual Instruments (VI) technology. Through the experimentation of the auto-testing system, it indicates that the designed auto-testing system can completely meet the performance test of the equipment.

关键词： auto-testing system Virtual Instruments Technology single chip LabWindows/CVI

作者: Guo Deqing JiangYoucai Fang Liqing Zhang Ning

作者单位: Department of Mechanical Engineering, Mechanical Engineering Institute

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 2762-2764

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）