Research of Multi-parameter Data Collecting and Processing System Based on LabVIEW

摘要：

The computer technology combined with the measuring instrument technology make the emergence of a new test instrument - virtual instrument. The data acquisition system based on LabVIEW is the third generation of automatic test system development direction. This article realizes a set of multi-parameter synchronous data acquisition and processing system based on LabVIEW.

关键词： data collection LabVIEW virtual instrument DSP

作者: LUO Wei HAN WenBo

作者单位: School of Information Engineering,Jilin Teachers Institute of Engineering And Technology,Changchun, School of Optoelectronic Engineering,Changchun University of Science and Technology,Changchun,Jinlin

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 3176-3178

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）