会议专题

Design of Air-tight Property Detector Based on Cygnal MCU

In this paper, a design based on the dry waste detection method (direct pressure test) C8051F021 single-chip technology combined with gas-tight-checking device. The use of high-precision A/D on the pressure and temperature signals detected through the LCD display real-time collection of data on pressure and provide a communications interface for data storage and analysis. To overcome the traditional method of vulnerability to subjective factors such as shortcomings to achieve the air tightness test automation.

Air Tightness cygnal MCU Dry Leakage Detecting

AN Xin HAN Yu GUO Jia WANG Jingshuang

School of Informantion and Electric Engineering, Hebei University of Engineering, Handan, Hebei, China,056038

国际会议

第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

重庆

英文

3240-3243

2009-08-01(万方平台首次上网日期,不代表论文的发表时间)