The study and analysis of over-drive characteristic for TTL component

摘要：

It is a practical method to use the characteristic of twinkle-over-loading of semiconductor component to isolate and diagnosis digital component faults in-circuits. In this paper the characteristic of twinkle-over-loading of TTL component is studied with experiment and its curve of over-drive is obtained. Also the reason of twinkle-over-loading characteristic is explained with the movement of micro-electronics. The result of this paper can give a strong backup of design digital circuit fault diagnosis system based on over-drive.

关键词： Over-drive fault isolation TTL Component digital circuit system

作者: He Huafeng Xia Kehan

作者单位: Institute.of Hi-Tech.Xian, Shannxi, China, 710025

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 3272-3275

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）