Research on Hierarchical Test Buses Technique

摘要：

A technique of hierarchical test buses is presented, which adopt a structured, hierarchical design methodology. The IEEE 1149.5 Module Test and Maintenance bus (MTM-bus) is used in test of system level, and IEEE 1149.1 is used in test of board level and chip level. The applications in various weapon systems such as F-22, have proved its advantages.

关键词： DFT IEEE Std 1149.1 IEEE Std 1149.5

作者: Zhang Yansheng Chen Jianhui Jing Jianhui

作者单位: Mechanical Engineering College, Shijiazhuang, Hebei, China, 050003

会议类型: 国际会议

会议名称: 第八届国际测试技术研讨会(8th International Symposium on Test and Measurement)

会议地点: 重庆

会议语种:英文

页码: 3472-3475

在线出版日期: 2009-08-01（万方平台首次上网日期，不代表论文的发表时间）