Study the Surface Charge of Both original and corona-resistant Polyimide films by Electrostatic Force Microscope
Electrostatic Force Microscope (EFM) was applied to study the origin and decay properties of surface charge on original and corona-resistant Polyimide films in micro-nanometer scale. The surface charge were generated by injecting on the surfaces of the polyimide (PI) films using the conductive probe of EFM. After the surface charge were characterized by EFM, the results indicate that the difference origin and decay properties between original (100HN) and corona-resistant (100CR) polyimide films. Corona-resistant polyimide film accumulated less surface charge after injected charge and quicker decay, so the residual charge smaller than original Polyimide films. The decay time constant corresponding to the resistivity of each film. The research provides a new way for study on the rule and mechanism of generating and decaying surface charge on the insulated films and can be used to partially explain the mechanism of corona resistant.
Electrostatic Force Microscope (EFM) surface charge decay polyimide (PI) corona resistant
Zhi SUN Bai HAN Xuan WANG Qingquan LEI
College of Electrical & Electronic Engineer, Harbin University of Science and Technology, Harbin, 150040, China Key Laboratory of Engineering Dielectric and Its Application, Ministry of Education, Harbin University of Science and Technology, 150040, China
国际会议
哈尔滨
英文
942-945
2009-07-19（万方平台首次上网日期，不代表论文的发表时间）