Mechanical Strength and Hermiticity of Moisture Protection Units of Thinfilm and Electrolytic Capacitors

摘要：

Paper represents the theoretical and experimental analysis of the most spread defect in thin-film and electrolytic capacitors – their humidity-protective units breaking. The calculation of forces acting in capacitor under overpressure, and also tension measuring method for capacitors tightness verifying are given.

关键词： capacitor hermetization compound contact pressure stress

作者: V.Royzman A.Goroshko A.Bubulis

作者单位: Khmelnitsky National University, 11, Institutskaya str., Khmelnitskiy, 29016,UKRAINE Kaunas University of Technology, Kestucio 27, Kaunas, LT- 44025, Lithuania

会议类型: 国际会议

会议名称: The Eighth International PCIM China(第八届电子功率器件、智能传送、电源质量国际研讨会)

会议地点: 上海

会议语种:英文

页码: 101-105

在线出版日期: 2009-06-02（万方平台首次上网日期，不代表论文的发表时间）