A Clock Fault Detection Circuit for Reliable High Speed System by Time-to-Voltage Conversion
A novel architecture for clock fault detection circuit for high speed nanoelectronic system is delivered. Time-to-voltage converter is employed for transforming error of time to the error of voltage which is more convenient for error detection. The rapid discharging circuit is also used for system resetting. To illustrate the detection capability by the diction circuit, a prototype CMOS design of this proposed circuit is presented. Simulation result shows that the proposed architecture is very suit for integration to nanoelectronic circuit design to detect the fault of the clock.
nanoelectroic clock fault fault tolerance fault detection
Changhong Yu
College of Information & Electronic Engineering Zhejiang Gongshang University Hangzhou, China
国际会议
Second International Symposium on Electronic Commerce and Security(第二届电子商务与安全国际研究大会)(ISECS 2009)
南昌
英文
939-942
2009-05-22（万方平台首次上网日期，不代表论文的发表时间）