EPITAXIAL GROWTH OF NON-POLAR A-PLANE ZNO ON R-PLANE SAPPHIRE SUBSTRATES BY MOCVD AND RF-SPUTTERING
Epitaxial growth of non-polar (1120) ZnO thin films (a-plane ZnO) on (1102) sapphire (r-plane sapphire) were successfully implemented through metal organic chemical vapor deposition (MOCVD) and radio-frequency sputtering, respectively. For ZnO film deposited by sputtering, the growth temperature and the flow ratios of argon to oxygen were shown to significantly influence the crystalline quality and surface morphology of ZnO films. Rat surface ZnO epitaxial film can be grown by MOCVD. The epitaxial relationship between ZnO and sapphire substrate is
ZnO epitazial growth XRD AFM TEM
HOU-GUANG CHEN GUO-JU CHEN SHENG-RUI JIAN GOU-ZHI HUANG JHIH-WEI NI
Department of Materials Science and Engineering, I-Shou University, Kaohsiung 840, Taiwan, Republic of China
国际会议
第五届先进材料与加工国际会议(Fifth International Conference on Advanced Materials and Processing ICAMP-5)
哈尔滨
英文
1154-1159
2008-09-03(万方平台首次上网日期,不代表论文的发表时间)