A Simple X-ray Spectrometer and PC-based Data Acquisition System for Newly Developed X-ray Source Based on Laser Compton Scattering

摘要：

A simple X-ray spectrometer and a PC-Based Data Acquisition System(DAS) have been developed newly in Shanghai Institute of Applied Physics(SINAP),Chinese Academy of Sciences (CAS) for the measurement of the X-ray source generated using laser Compton scattering.The system consists of liquid nitrogen cooled high resolution Si(Li) detector,electronics and a DAQ.The Si(Li) detector was designed and made by Center of Advanced Instruments in SINAP,CAS,it allows us to measure X-rays with the energy up to 60 keV and the energy resolution(FWHM) of 184 eV at 5.9 keV.We measured the system uncertainty was 0.2 eV and time drifting of detector was 0.05％ both at 5.9 keV.The DAQ was based on Object-Oriented software LabVIEW 7.1,it has data on-line analysis and original data saved functions.

关键词： laser Compton scattering Si(Li) detector energy resolustion

作者: LUO Wen XU Ben-ji XU Wang PAN Qiang-yan XU Yi FAN Gong-tao FAN Guang-wei YANG Li-feng LI Yong-jiang YAN Zhe

作者单位: Shanghai Institute of Applied Physics,Chinese Academy of Sciences,Shanghai 201800,China;Graduate Sch Shanghai Institute of Applied Physics,Chinese Academy of Sciences,Shanghai 201800,China Graduate School of Chinese Academy of Sciences,Beijing 100049,China

会议类型: 国际会议

会议名称: 3rd China-Japan-Korea Hadron and Nuclear Physics 2008 Symposium(第三届中日韩强子物理与核物理研讨会)

会议地点: 兰州

会议语种:英文

页码: 115-118

在线出版日期: 2008-06-23（万方平台首次上网日期，不代表论文的发表时间）