Improving the Reliability of Single-Ended Induction-Cooking Appliances Based on the Quasi-Resonant ZVS-Topology
This paper presents an optimized control scheme for portable single-plated induction cooking appliances improving the reliability of the power semiconductor. A low-power portable induction heating controlling scheme based on a parallel-resonant technique circuit is demonstrated. The detection of fault conditions based on monitoring of the input voltage and a safer operation during these conditions is given. The controlling scheme is based on a frequency variation with a variable turn-on-time of the power semiconductor. The most favourable use and the benefits of latest generation of the Reverse Conducting IGBT are analysed. The proposed controlling scheme is verified by SPICE simulations. A test board with the focus on the reliability of the circuit was designed and evaluated.
Thomas Kimmer Joerg Oehmen
Infineon Technologies AG 81726 Munich, Germany
国际会议
The Seventh International PCIM China(第七届电子功率器件、智能传送、电源质量国际研讨会)
上海
英文
149-152
2008-03-18（万方平台首次上网日期，不代表论文的发表时间）