Structural Analysis of R & D Division from Patent Documents

摘要：

This paper describes a method to draw the network of inventors and their technology. It is based on the cooccurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.

作者: Yurie Iino Yasuhiro Yamada Sachio Hirokawa

作者单位: Graduate School of Information Science and Electrical Engineering Department of Mathematics and Computer Science, Shimane University Research Institute for Information Technology, Kyushu University, Hakozaki 6-10-1, Fukuoka 812-8581,

会议类型: 国际会议

会议名称: AiR08，EM2108，SOAIC08，SIOKM08，BIMA08，DKEEE08(2008IEEE国际电子商务工程学术会议)

会议地点: 西安

会议语种:英文

页码: 423-428

在线出版日期: 2008-10-22（万方平台首次上网日期，不代表论文的发表时间）