Spectral Reflectance Measurement Facility of Diffuse Reflectance Sample

摘要：

An integrating sphere and grating monochrometer based spectral reflectance measurement facility was developed by NIM for indirect spectral emissivity measurement. Normal spectral emissivity of diffusion sample was determined by measuring approximately 0-d spectral reflectance. The spectral reflectance measurement can be carried out from 2 μm to 15 μm for the sample temperature ranging from ambient temperature to 200 ℃. A lock-in amplifier coupled optical chopper was adopted to measure the output of the liquid nitrogen cooled MCT detector, and the site of optical chopper in the light path was considered seriously to pick out the wanted reflected incidence. The spectral reflectance of homemade sample was tested with this facility.

关键词： Metrology Spectral Reflectance emissivity Integrating Sphere Grating monochrometer

作者: BAI Cheng-yu YUAN Zun-dong DONG Wei DUAN Yu-ning

作者单位: National Institute of Metrology, Beijing 100013, China

会议类型: 国际会议

会议名称: 2008年国际温度与热物性测量会议(TEMP BEIJING 2008)

会议地点: 北京

会议语种:英文

页码: 261-264

在线出版日期: 2008-10-20（万方平台首次上网日期，不代表论文的发表时间）