Dynamic-Adaptive Field Induced Charged Device Model (FICDM)Compact Tester Model

摘要：

This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.

作者: Thorsten Weyl Dave Clarke Karl Rinne

作者单位: Analog Devices,Raheen Business Park,Limerick,Ireland Circuits and Systems Research Centre,University of Limerick,Limerick,Ireland

会议类型: 国际会议

会议名称: 9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)

会议地点: 北京

会议语种:英文

页码: 444-447

在线出版日期: 2008-10-20（万方平台首次上网日期，不代表论文的发表时间）