Statistical Design Characterization of Analog Circuits

摘要：

Analog designs typically employ multiple core building block circuits,including current mirrors,band gap references,differential pairs and op amps,which require precisely matched performance between multiple devices. However,due to the statistical nature of the fabrication process,there will always be slight differences between these critical devices,contributing towards increased variation in circuit performance. Understanding the impact and potential interactions of variations between these matched devices may be critical in producing a commercially viable product.Following a brief overview of the nature of statistical process variation,we will demonstrate how to systematically evaluate components of a band gap circuit to isolate matching sensitivities and refine the sizings for optimized results.

作者: Timwah Luk David C.Potts

作者单位: Fairchild Semiconductor,South Portland,ME 04106,USA

会议类型: 国际会议

会议名称: 9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)

会议地点: 北京

会议语种:英文

页码: 1705-1708

在线出版日期: 2008-10-20（万方平台首次上网日期，不代表论文的发表时间）