会议专题

Eztending the test paradigm beyond the technology dissemination

The escalating demand for technology integration in and around CMOS devices and the introduction of a large variety of new processes and structures to achieve challenging new product features is yielding new systems with an increasing level of test complexity. A broad range of applications and devices are congregating into smaller integrated systems with multiple and diverse features. Taken separately,these devices are testable using ad-hoc verification tools and/or structured testing methodologies. However when,integrated together they lose the ability to be verified in an efficient and cost effective way. Ad-hoc fault models and judicious test methodologies will therefore need to be specifically developed.High speed circuits and systems in their vast majority are still invariably based on CMOS technology for obvious cost and power efficiency reasons. RF processing is producing another level of complexity in the new emerging variety of embedded mixed-signals circuits and systems where a signal changes its media types several times without leaving the package assembly. Photonics is also gaining momentum in these emerging systems and although it is traditionally found in telecommunications it is increasingly found in high performance computing and recently in standard computing systems with the main target of alleviating the CPU to memory bottleneck. In this paper we present an example of a new test paradigm using a photonic application used in telecommunication to illustrate an approach of test generation for an emerging technology. This test technique can be easily incorporated in the current digital test techniques using ATE (Automated Test Equipment) and therefore allowing economical large scale production testing of devices combining electrical and optical signals.

Adam Osseiran

National Networked TeleTest Facility,Edith Cowan University Perth,Australia

国际会议

9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)

北京

英文

2066-2069

2008-10-20(万方平台首次上网日期,不代表论文的发表时间)