On Zero Clock Skew Hold Time Failure in Scan Test

摘要：

This paper studies a new hold time failure mode found in deep sub-micron low power CMOS production scan testing. The root causes of failure are discovered and duplicated in simulations. Vccmin of scan chain integrity is defined and studied for the first time. Solutions for enhancing scan chain integrity are proposed.

关键词： Scan test failure process local variability hold time failure scan flop design Vccmin

作者: Xiaonan Zhang Xiaoliang Bai Michael Laisne Charlie Matar

作者单位: QUALCOMM,Inc.San Diego,CA 92121,USA

会议类型: 国际会议

会议名称: 9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)

会议地点: 北京

会议语种:英文

页码: 2070-2074

在线出版日期: 2008-10-20（万方平台首次上网日期，不代表论文的发表时间）