A Novel RF Phase Error Built-in-Self-Test for GSM

摘要：

This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented,which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products.

作者: D.Webster R.Hudgens L.Phan O.Eliezer D.Y.C.Lie

作者单位: Department of Electrical and Computer Engineering,Texas Tech University,Lubbock,TX 79409

会议类型: 国际会议

会议名称: 9th International Conference on Solid-State and Integrated-Circuit Technology(第9届固态和集成电路国际会议)

会议地点: 北京

会议语种:英文

页码: 2075-2078

在线出版日期: 2008-10-20（万方平台首次上网日期，不代表论文的发表时间）