Optimal Design Approach for Accelerated Life Test of Electronic Equipments

摘要：

This paper analyzes the electrical connectors failure mechanism and lifetime model under the combination of temperature stress and vibration stress. And it is helpful for transformed stresses to conveniently get the linear extreme-value distribution and its parameter estimates. Using maximum likelihood estimate (MLE), the asymptotic variances of extrapolated lifetime quantile P at the normal stress level is the objective function to be optimized. So the optimal accelerated life test design model is established, which considers some constraint conditions and uniform orthogonal design requirements. Then the optimal test plan is given simulation evaluate by Monte-Carlo method. The design approach provided in this paper is available for constant stress accelerated life test of electronic equipment. And Numerical example shows that the optimal test plan can reduce example numbers and test cost and shorten test time.

关键词： Accelerated Life Test Optimal Design MLE Simulation Evaluation

作者: YI Dangxiang LIU Chunhe

作者单位: D8 Qinghe Building, Beijing, P.R.China, 100085

会议类型: 国际会议

会议名称: 2008年国际应用统计学术研讨会(2008 International Institute of Applied Statistics Studies)

会议地点: 烟台

会议语种:英文

页码: 1-7

在线出版日期: 2008-08-14（万方平台首次上网日期，不代表论文的发表时间）