Studies on structure-electrochemical conduction relationships in doped-zirconia thin films
Microstructural studies have been carried out on yttria doped zirconia (YDZ) thin films grown on MgO(100) and Ge(100) single crystal substrates using in-situ transmission electron microscopy. Microstructure evolution is strongly impeded in films grown on Ge (100) when thickness is less than 30 ran. Electrical studies show one order of enhancement in total conductivity in films of thickness less than 20 nm grown on MgO substrate. For 17 nm films that show enhanced conductivity, the activation energy obtained from electrical relaxation is ～1.7 eV while it is ～ 1.1 eV for 933 nm thick films.
Ozide Electron microscopy Ion transport Thin films
Annamalai Karthikeyan Masaru Tsuchiya Shriram Ramanathan
School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA
国际会议
The 16th International Conference on Solid State Ionics(第十六届国际固态离子学会议)
上海
英文
1234-1237
2007-07-01（万方平台首次上网日期，不代表论文的发表时间）