Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances

摘要：

The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target.It allows for predicting beam losses in limiting apertures and the beam focus size at the target.Various definitions and issues are discussed.The most common and emerging measuring techniques are presented,including their advantages.Several methods of emittance data analysis,their accuracy and trustworthiness,are discussed.

关键词： ion beams ion beam transport ion beam emittance ion beam diagnostics emittance analysis

作者: M.P.Stockli

会议类型: 国际会议

会议名称: The 17th International Workshop on ECR Ion Sources and Their Application(第17届国际ECR离子源研讨会)

会议地点: 兰州

会议语种:英文

页码: 182-186

在线出版日期: 2006-09-17（万方平台首次上网日期，不代表论文的发表时间）