The noise analysis and its suppression in CMOS ROIC for microbolometric infrared focal plane array

摘要：

The readout integrated circuit (ROIC) for micro-bolometric infrared focal plane array (IRFPA) is commonly fabricated in silicon complementary metal oxide semiconductor field effect transistor (CMOS) technology. There are three main categories of noise in a typical CMOS ROIC, which are f / 1 noise, KTC noise and fixed pattern noise. These noises in CMOS ROIC can seriously restrain the dynamic range of the ROIC and degrade the performance of IRFPA. A new CMOS ROIC for micro-bolometric IRFPA is designed to suppress the noises, and its performance is successfully verified through the theory analysis and experimental results in this paper.

关键词： readout integrated circuit low noise CMOS micro-bolometer focal plane array

作者: Xiqu Chen

作者单位: Department of Mathematics and Physics，Wuhan Polytechnic University，Wuhan 430023,China

会议类型: 国际会议

会议名称: 2008亚太光通信会议(Asia-Pacific Optical Communications 2008)

会议地点: 杭州

会议语种:英文

在线出版日期: 2008-10-26（万方平台首次上网日期，不代表论文的发表时间）