A New Control Chart for Detecting the Outbreak of Negative Events

摘要：

This article presents a Statistical Process Control (SPC) chart (called the rate chart) for simultaneously monitoring the time interval (t) between the occurrences and the intensity (x) of a negative event. By monitoring the ratio between x and t, this new chart is more effective than an individual t chart or individual x chart for detecting the out-of-control status of the event or the upward shifts (frequent occurrence and/or high intensity). Moreover, the rate chart performs more uniformly over a large domain of process shift comparing with the individual t or x chart.

关键词： Quality control Control chart Intensity of event Statistical process control Times between events

作者: Zhang WU Jianxin JIAO Zhen HE

作者单位: School of Mechanical and Aerospace Engineering,Nanyang Technological University,Singapore 639798 School of Management,Tianjin University,China 300072

会议类型: 国际会议

会议名称: 工业工程与系统管理2007年国际会议(International Conference on Industrial Engineering and Systems Management)(IESM 2007)

会议地点: 北京

会议语种:英文

在线出版日期: 2007-05-30（万方平台首次上网日期，不代表论文的发表时间）