Optimum Design of Multi-finger SiGe HBT with Non-uniform Length for Power Application
With a three-dimensional thermal-electrical model,a non-uniform emitter length structure in multi-finger SiGe heterojunction bipolar transistors (HBTs) is presented to improve thermal stability.Compared with the traditional uniform emitter length design,the peak temperature of multifinger SiGe HBT with non-uniform length is lowered.Therefore,it can operate at large current and has a higher power handling capability in power application.
Hu Ning Zhang Wan-rong Jin Dong-Yue Xie Hong-Yun Huang Lu Huang Yi-Wen Shen Pei Li Jia Gan Jun Ning
College of Electronic Information and Control EngineeringBeijing University of TechnologyBeijing 100 College of Electronic Information and Control Engineering;Beijing University of Technology Beijing 1
国际会议
昆明
英文
2008-11-01(万方平台首次上网日期,不代表论文的发表时间)