Simulation of PIN Diode Under Electromagnetic Pulse Based on Decision Tree

摘要：

The Electromagnetic pulse probably disturbs the normal operation of the PIN diode temporarily ,or even damages the PIN diode permanently.Unlike just studying a certain aspect on the impact of the PIN diode in the other papers,the approach of decision trees is adopted to reveal the relationship between the extent of the PIN diode damage and the parameters (the rise time,width,and voltage) of electromagnetic pulse in an all-round manner.Besides,using decision tree to classify the degree of the PIN diode damage can save simulation time.

作者: Kai Xiang Zhengwei Du

作者单位: State Key Laboratory of Microwave and Digital Communications Department of Electronic Engineering, T State Key Laboratory of Microwave and Digital Communications;Department of Electronic Engineering,Ts

会议类型: 国际会议

会议名称: 第八届电磁理论、天线及传播国际研讨会

会议地点: 昆明

会议语种:英文

在线出版日期: 2008-11-01（万方平台首次上网日期，不代表论文的发表时间）