A novel fast EMC test and data correction method
A band-width broadening method in fast Electromagnetic Compatibility (EMC) test which can speeds up the process of radiated emission (RE) test is put forward.And then the frequency range where EMC problems may occur can probably be found quickly.So the test time can largely be shortened.Some formulas represented the relationship between band-width augment quantities and noise floor in EMI test receiver have been derived.These formulas can divide test results into three different regions based on different frequency range effectively and accurately.The meaning of these regions is defined so as to make the test speed up more precise.And a novel data correction algorithm is put forward in order to largely improve the precise of the test data without affecting the original speed.
Wan-Feng Gao Dong-lin Su Fei Dai Shu-guo Xie Cheng Cao
School of Electronics and Information Engineering,Beijing University of Aeronautics and Astronautics School of Electronics and Information Engineering,Beijing University of Aeronautics and Astronautics
国际会议
昆明
英文
2008-11-01（万方平台首次上网日期，不代表论文的发表时间）