Dual-frequency Scattering Measurement System for Radar CrossSection Imaging

摘要：

X band and Ka band front-ends are integretd into onemeasurement system in order to get radar cross section andimages of complex objects,software defined radaio is appliedin system design.Then ISAR processing technology isinvestigated to gain two dimension scattering centersdistribution,and radar cross section imaging and CBPalgorithm is verified to obtaining object information efficiently.

作者: Hu Weidong Sun Houjun Fu Pengcheng Lv Xin

作者单位: Beijing Institute of Technology,5 South Street of Zhongguancun,Haidian District,Beijing,P.R.China

会议类型: 国际会议

会议名称: 2008 China-Japan Joint Microwave Conference(2008年中日微波会议)

会议地点: 上海

会议语种:英文

页码: 516-520

在线出版日期: 2008-09-10（万方平台首次上网日期，不代表论文的发表时间）