Hidden Faults、Masking Failure Faults and Multiple Faults Diagnosis
Routine algorithms cannot diagnose multiple faults caused by hidden faults and masking failure faults in the system. In this paper, we propose an algorithm of identifying hidden faults and masking failure faults, analyze their relations to multiple faults and exclude the masking failure faults in the system through adding few test nodes in the system DFT. It can quickly find out the faulty components through analyzing the masking failure faults and hidden faults, saves cost of diagnosing faults, shortens test time and reduces the difficulty of diagnosing the multiple faults. Finally, the algorithms are validated by the examples.
Hidden faults masking failure faults multiple faults diagnosis design for test
Jiang Ronghua Huang Jianguo Wang Houjun Long Bing
School of automation,University of Electronics Science and Technology,Chengdu 610054,China
国际会议
北京
英文
2008-11-01（万方平台首次上网日期，不代表论文的发表时间）