Characterization of LTCC Substrate up to 100 GHz
This paper deals with the characterization of LTCC substrates up to 100GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.
S.Adhikari A.Stelzer A.Springer C.Wagner C.Korden M.Stadler
Institute for Communications and Information Engineering,Johannes Kepler Universitaet Linz,Austria Product Development-Advanced Modules EPCOS OHG,Deutschlandsberg,Austria
国际会议
2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)
南京
英文
1776-1779
2008-04-21(万方平台首次上网日期,不代表论文的发表时间)