Reflection and Dielectric Characteristics of TbDyFe Thin Film for High Frequency MEMS Sensors and Actuators
The fcmtosecond pump-probe experimental device was designed to investigate reflection and dielectric properties of TbDyFe thin films. Tb0.27Dy0.73Fe2 thin films were prepared by DC magnctron sputtering and the component,surface topography and crystalline property of TbDyFe thin films were measured by scanning electronic microscope (SEM) and atom force microscope (AFM). The extremum of reflectivity change corresponding to the electron thermalization was 100±0fs.Amplitude of extremum reaches its maximum at 160 mW pump flucnce and it turns to zero at 0 mW and echo wave was foundInreflectivity waveform. Combine with Fresnel reflect formula and K-K transformation,real and imaginary part of the complex dielectric constant was derived and it indicated that the absorption of thin film became greater with the increasing of reflection at surface after 0 ps delay time,but absorption of thin fdm recover to its initial state after lps.
Yang Zhiqiang Weng Mengchao
Vocational and Technical College,Zhejiang Normal University Jinhua,Zhejiang,321019,China
国际会议
2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)
南京
英文
1544-1546
2008-04-21（万方平台首次上网日期，不代表论文的发表时间）