COMPLEX PERMITTIVITY EXTRACTION OF DIELECTRIC SAMPLES IN WAVEGUIDE

摘要：

This paper describes a method to determine the relative permittivity of a dielectric material in Printed Circuit Board.The dielectric sample in a PCB is placed to formA finline discontinuity of finite length Ina waveguide. S-parameter of a discontiuity from an empty waveguide to finline and back to empty waveguide is measured. An errorfunction that compares the measured and calculated S-parameters of the discontinuity is minimized to extract the permittivity of the sample. The optimization is based onA practical Quasi-newton algoritm. The calculated value of the S-parameter used in the error function is obtained from the modal expansion of the fieldsInthe empty waveguide and the finline structure. Field matching is done at the disconitinuity to yield the theoretically calculated S-paramters.

作者: Uma Balaji

作者单位: Dept.of Electrical and Computer Engineering,California State University,Chico,CA 95929

会议类型: 国际会议

会议名称: 2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)

会议地点: 南京

会议语种:英文

页码: 1294-1297

在线出版日期: 2008-04-21（万方平台首次上网日期，不代表论文的发表时间）