Electromagnetic Parameters Measurement for Thin Film Materials
A new method is proposed in This paper to measure the electromagnetic parameters of thin film materials. The multiple mierostrip is used as measure configuration. The formulations are deduced to calculate the electromagnetic parameters of the thin films,and the commercial software IE3D is used to obtain the S-parameters of the configuration. The results show that,by using This proposed method,the error of the real part of permeability is less than 5％ and the error of the imaginary part of permeability is below 0.05.
Yunqiu Wu Zongxi Tang Biao Zhang Xi He
School of Electronic Engineering,University of Electronic Science and Technology of China Chengdu,China
国际会议
2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)
南京
英文
627-629
2008-04-21（万方平台首次上网日期，不代表论文的发表时间）