Sensitive measurement of surface resistance of conductive films using dielectric resonator

摘要：

Two measurement systems for microwave surface impedance of conductive thin films were presented. The advantage and disadvantage of the measurement systems were discussed. The structure of measurement was first designed.

作者: Xuewen Sun

作者单位: The 41 st Research Institute,CETC National Key Lab of Electronic Measurement Technology

会议类型: 国际会议

会议名称: 2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)

会议地点: 南京

会议语种:英文

页码: 624-626

在线出版日期: 2008-04-21（万方平台首次上网日期，不代表论文的发表时间）