The research for ESD thermal breakdown model of electronic device

摘要：

A physical model of electronic devices ESD thermal breakdown is proposed in this paper,and the two depth of PN junctions thermal breakdown was discussed and also discussed ESD breakdown vokage for different depth of PN junction.

关键词： technology of control ESD electrostatic discharge(ESD)

作者: K.P.Sun M.XU

作者单位: Electrostatic Institute of Shanghai Maritime University,Post Code:200135,Shanghai,China

会议类型: 国际会议

会议名称: The 6th International Conference on Applied Electrostatics(第六届国际静电应用会议)

会议地点: 上海

会议语种:英文

页码: 275-280

在线出版日期: 2008-11-03（万方平台首次上网日期，不代表论文的发表时间）