SURFACE STRUCTURES ON CLEAVED SILICON BY CLEAVAGE LUMINESCENCE DETECTION

摘要：

This paper reports on further research into the structure and properties of thecleaved surfaces of silicon,using vacuum cleavage luminescence detection methodsand outlines experiments performed to gain further information about the structureand properties of cleaved silicon surfaces.The experiments involved detecting theluminescence produced after cleaving thin silicon plates within a high vacuum,by aprocess of converting the luminescence to an electrical signal which could beamplified and measured accurately.Three signals have been detected and discussed.

关键词： surface structure cleavage luminescence semiconductor materials

作者: D.Li

作者单位: School of Computer and Information Science,Edith Cowan University,Australia.

会议类型: 国际会议

会议名称: 第二届国际非均质材料力学会议(The Second International Conference on Heterogeneous Material Mechanics)

会议地点: 安徽黄山

会议语种:英文

页码: 522-525

在线出版日期: 2008-06-03（万方平台首次上网日期，不代表论文的发表时间）