ATOMISTIC MODELING SIZE DEPENDENCE OF NANO-VOIDED COPPER YIELDING UNDER UNIAXIAL TENSION

摘要：

Molecular dynamics (MD) simulations on cylindrical voided copper behaviors under uniaxial tension are performed,to study the size dependence of stress-strain response curve and dislocation emission from void free surface.The Embedded Atom Method (EAM) potentials developed by Foils et al.And Mishin are adopted.Atomistic calculation shows the larger matrix has the lower yield stress and the critical stress for dislocation emission decreases with increasing the void size.By employing common neighbor analysis method,it is found phase transformation inducing at the yielding point from the void free surface.This size dependence is expected to provide some helpful insights on understanding the damage mechanism at nano scale.

关键词： molecular dynamics simulation void growth size dependence

作者: K.J.Zhao C.Chen

作者单位: MOE Key Laboratory of Strength and Vibration,Xian Jiaotong University,China

会议类型: 国际会议

会议名称: 第二届国际非均质材料力学会议(The Second International Conference on Heterogeneous Material Mechanics)

会议地点: 安徽黄山

会议语种:英文

页码: 338-341

在线出版日期: 2008-06-03（万方平台首次上网日期，不代表论文的发表时间）