Investigation on Backscattering from 1D Weierstrass Rough Surface of Layered Medium

摘要：

The electromagnetic scattering from the 1D Weierstrass rough surface of three-layered medium is studied,the formulae of the scattering coefficient for different polarization is derived using the small perturbation method. The influence of the fractal dimension,the numbers of tons,the fundamental spatial frequency ,the root mean square of rough surface,the permittivity of substrate medium,the permittivity and the mean layer thickness of intermediate medium and the frequency of the incident wave on the backscattering coefficient of HH polarization are obtained and discussed with numerical implementation.

作者: X.C.Ren L.X.Guo

作者单位: School of Science,Xidian University,Xian,Shaanxi 710071 China College of Physics and Electronic Inf School of Science,Xidian University,Xian,Shaanxi 710071 China

会议类型: 国际会议

会议名称: 2008 International Conference on Microwave and Millimeter Wave Technology(2008国际微波毫米波技术会议)

会议地点: 南京

会议语种:英文

页码: 1726-1729

在线出版日期: 2008-04-21（万方平台首次上网日期，不代表论文的发表时间）