Study on Spectrometer Induced Periodic Fluctuant Error in EFPI Strain Sensing System

摘要：

An EFPI strain sensing system,with DGT demodulation algorithm,was tested by a continuous loading setup.A periodic fluctuant error was observed during those experiments.Theoretical study shown that,the spectrometer has spectral background noise in wavelength domain,and it will induce a sine cardinal function noise in the gap length domain.That is the reason of the periodic fluctuant error.A background spectrum subtraction demodulation algorithm was put forward to address this problem.Experimental results demonstrated the validity of the theoretical analysis and the improved demodulation algorithm.

关键词： EFPI fiber optic sensor periodic fluctuant error health monitoring DGT

作者: Xiong Gan Yong Zhu Hao Mei Peng Zhang Weimin Chen

作者单位: Key Laboratory for Optoelectronic Technology & System,Education Ministry of China College of Opto-electronic Engineering,Chongqing University,Chongqing 400030,China

会议类型: 国际会议

会议名称: The World Forum on Smart Materials and Smart Structures Technology(SMSST07)(2007年世界智能材料与智能结构技术论坛)

会议地点: 重庆·南京

会议语种:英文

在线出版日期: 2007-05-01（万方平台首次上网日期，不代表论文的发表时间）