Automatic Test Solution for Interrupt-driven Based Embedded Software

摘要：

The optimization of test process can bring notable efrect on the whole control of quantity,cost and period of embedded software.In this paper,the characteristics and test requirements of interrupt driyen based embedded software are analyzed first,subsequently,the design and implementation of a distributive automatic test solution is presented respectively.Finally,both advantages and disadvantages of automatic test in embedded software test are presented.

关键词： Software test Interrupt driven Embedded software Automatic test solution

作者: Mei Gong YueWu

会议类型: 国际会议

会议名称: The International Conference Information Computing and Automation(2007国际信息计算与自动化会议)

会议地点: 成都

会议语种:英文

页码: 1517-1520

在线出版日期: 2007-12-19（万方平台首次上网日期，不代表论文的发表时间）