Role of competing failure model in reliability estimation

摘要：

For high reliable devices reliability estimation accelerated life test is an optimum approach, it can accelerate failure causes by increasing stress above their operating stress and make extrapolate reliability parameters in the condition that only one failure mechanism at test, (Wang Bmgxing, 2002; Deng Aimin, Chen Xun, Zhang Chunhua., 2006) but there is risk that there is more than one failure mechanism at higherstress. The former condition may make reliability estimation higher than that of actual operation (Li Wenjian, Hoang Pham, 2005, J.M.Hu., 1992; J.Hariharan Nair, 2002).

作者: Fang ZHANG Jinyan CAI Yanhui ZHU

作者单位: Optics and Electronics Department,Ordnance Engineering College,Shijiazhuang,050003,China The military representative section stayed in 5413 factory,Shijiazhuang

会议类型: 国际会议

会议名称: 2008 International Conference on Risk and Relianility Management(2008风险与可靠性管理国际会议)

会议地点: 北京

会议语种:英文

页码: 722-725

在线出版日期: 2008-11-10（万方平台首次上网日期，不代表论文的发表时间）