Constant stress ADT for superluminescent diode and statistical analysis

摘要：

Within severe time and cost constraints, constant stress accelerated degradation testing (CSADT) was utilized to evaluate high reliability and long life of Superluminescent Diode (SLD). Firstly, the assumptions of CSADT were given On the basis of FMECA and FTA results of SLD, accelerated model was determined. Then, by the means of drift Brownian movement crossing continuous boundary and time scale transformation, reliability evaluation model of CSADT with non-linear degradation was generated. According to the independence increment property of drift Brownian movement, the maximum likelihood and regression analysis were used to evaluate the parameters of reliability model. Engineering application validated that reasonable evaluated results could be obtained by the methodology proposed in this paper.

关键词： life reliability performance degradation accelerated testing optical component Brown Movement

作者: Xiaoyang LI Tongmin JIANG Jing MA Shuying CHEN

作者单位: Department of System Engineering of Engineering Technology,Beihang University Beijing 100191,China School of Instrument Science&Opto-electronics Engineering,Beihang University,Beijing 100191,China School of Instrument Science & Opto-electronics Engineering,Beihang University,Beijing 100191,China

会议类型: 国际会议

会议名称: 2008 International Conference on Risk and Relianility Management(2008风险与可靠性管理国际会议)

会议地点: 北京

会议语种:英文

页码: 703-706

在线出版日期: 2008-11-10（万方平台首次上网日期，不代表论文的发表时间）