New Automatic Voltage Control Designs for Enhanced ESP Systems Integration,Improved Reliability, Safety and Troubleshooting Capabilities
Modern high speed microprocessors, advanced display technologies and recently developed circuit protection components have allowed a new generation of ESP controls to be developed. This paper reviews the advances made and how they impact users.Specifics of the designs will be shown and described along with real-world examples of their application. A discussion of the rational behind features such a Closed Door troubleshooting, and multi-language support will be discussed. Closed Door troubleshooting is critical to minimize the risk of Arc-Flash injuries. Multi-Language support is becoming a requirement to ensure that the controls are setup and used properly wherever they are installed. Both of these requirements put demands on the electronics and display technologies which drive the choice of components and support circuitry. A description of the design trade-offs made during the development process will be included. Field experience with the new design, reliability statistics and plans for future development will complete the presentation.
Voltage Control ESP review
John Comer Royce Warnick Mike Volker Jason Horn
Stock Equipment Company,Inc.16490 Chillicothe Road.Chagrin Falls,Ohio 44023-4398
国际会议
11th International Conference on Electrostatic Precipitation(第11届国际电除尘学术会议)
杭州
英文
298-303
2008-10-15（万方平台首次上网日期，不代表论文的发表时间）