Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software

摘要：

In order to solve the problem that the fixed duration testing method,which based on the classical statistics,cant satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration,a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling,maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.

作者: Zhidong Qin Hui Chen Youqun Shi

作者单位: School of Computer Donghua University Software Engineering Institute East China Normal University

会议类型: 国际会议

会议名称: The 2008 International Conference on Embedded Software and Systems Symposia(ICESS 2008)(2008国际嵌入式系统及嵌入式软件会议)

会议地点: 成都

会议语种:英文

页码: 481-487

在线出版日期: 2008-01-01（万方平台首次上网日期，不代表论文的发表时间）