Scanning Electron Microscope (SEM) of leaf cell morphology and inheritance for Corn Leaf Aphid (CLA) resistance in Maize
Corn Leaf Aphid (CLA) was first named A phis maidis by Fitch (1856) and later given the scientific name Rhop alosiphum maidis Fitch.It is one of the most abundant species among the twelve species found on maize in the United States (Stoetzel and Miller,2001). CLA is considered to have originated in Asia.It occurs throughout the world and is an economically important cereal aphid species in tropical climates (Blackman and Eastop,1984).In North America, it migrates annually from south to north ( Kieckhefer et al.,1974).CLA infestations can be influenced by environmental factors such as the plant densities and N2 level of the host.Ali and Ahmed (1996) found that CLA infestation increased with higher plant densities and host N2 content in wheat.Temperature is probably the most important environmental variable influencing rates of aphid development and reproduction.Corn leaf aphids can cause occasional yield loss of maize.We have observed genetic resistance to the aphid species.An improved artificial inoculation technique with hairpin clip cages was devised.The purposes of this study were to develop manual infestation techniques and quantification methods for screening aphid resistance in tropical maize and to study the leaf cell morphology and to apply the techniques in field trials.
Corn Leaf Aphid (CLA) Scanning Electron Microscope( SEM) Maize
H.C.Ji J.K.Lee B.R.Sung K.Y.Kim K.J.Choi K.B.Lim W.H.Kim S.Seo
Grassland & Forages Division,National Institute of Animal Science,RDA,Cheonan,Chungnam 330-801,Korea
国际会议
呼和浩特
英文
2008-06-29（万方平台首次上网日期，不代表论文的发表时间）