Interfacial forces between silica surfaces measured by atomic force microscopy

摘要：

Interfacial force interactions between particles and/or surfaces are of essential importance in colloidal particle stability and surface adsorption of substances and their implication in environmental science and engineering systems are evident.The interfacial and/or molecular forces can be measured by atomic force microscopy(AFM)colloid probe.This paper presented a discussion on AFM colloid probe measurement of silica particle and silica wafer surfaces.The measured forces are then analysed and discussed based on theconstant chargeandconstant potentialmodels of DLVO theory.

作者: Jinming DUAN

作者单位: School of Environmental and Municipal Engineering,Xian University of Architecture and Technology,1.3 Yanta Road,Xian 710075,China

会议类型: 国际会议

会议名称: The International Conference on Advances in Chemical Technologies for Water and Wastewater Treatment(2008年化学技术对水及废水处理国际研讨会)

会议地点: 西安

会议语种:英文

页码: 89-93

在线出版日期: 2008-05-15（万方平台首次上网日期，不代表论文的发表时间）