An investigation on the onset of plastic deformation of nanocrystalline solid solution Ti-Al-N films

摘要：

The nanoscale deformation behavior of the solid solution Ti0.5AI0.5N thin film was systematically investigated by nanoindentation measurements. The effect of the tip radius of the indenter on the behavior of elastic-plastic deformation was also evaluated. The Hertzian stress analysis was used to determine the distribution of resolved shear stress at the initiate plastic deformation, and the obtained critical resolved shear stress was compared to the theoretical shear strength to establish correlations and differences. Comparison of the calculated critical shear stress and theoretical shear strength also indicated that new complete dislocation nucleation during nanoindentation was not the prerequisite of the onset of plastic deformation, even at very shallow indentation depth.

关键词： Solid solution thin films Nanoindentation Deformation Hertzian stress analvsis

作者: Y.Wang Eric Tam Y.G.Shen

作者单位: Key laboratory of Radiation Physics and Technology of Nuchlear Science and Technology.Sichuan Univer Department of Manufacturing Engineering and Engineering Management (MEEM).City University of Hong Ko

会议类型: 国际会议

会议名称: The Eighth International Conference on Fundamentals of Fracture(ICFF VIII)(第八届断裂基础国际会议)

会议地点: 香港·广州

会议语种:英文

页码: 4978-4984

在线出版日期: 2008-01-03（万方平台首次上网日期，不代表论文的发表时间）