The study on scan strategy in electron beam selective melting

摘要：

In electron beam selective melting (EBSM) process, powder pushed-away phenomena and uneven temperature field are two main obstacles, which are greatly associated with the electron beam scan mode. In this paper, variant scan strategies, including iterative scan mode, reverse scan mode,interlaced reverse scan mode, randomized block scan mode and constant length scan mode, are investigated. The analyses for each scan strategies are presented based on the influence to the temperature field over the formation zone and the powder pushed-away phenomena. The most promising strategy, interlaced reverse scan mode, is accomplished and approved by the ANSYS simulation and a two-dimensional scan experiment.

关键词： scan strategy electron beam selective melting powder pushed-away

作者: W Lu F Lin H B Q J D Han N S Yan Hsin-Nan Chou

作者单位: Department of Mechanical Engineering, Tsinghua University, Beijing. Peoples Republic of China Boeing Company, USA

会议类型: 国际会议

会议名称: 第三届北京国际快速成形及制造会议暨第二届北京国际生物制造会议(The 3rd International Conference on Rapid Prototyping and Manufacturing and The 2nd International Conference for Bio-manufacturing (ICRPM-BM 2008 Beijing))

会议地点: 北京

会议语种:英文

页码: 401-406

在线出版日期: 2008-11-06（万方平台首次上网日期，不代表论文的发表时间）